CPC H01L 23/573 (2013.01) | 14 Claims |
1. A method for detecting tampering with an electronic device, comprising:
forming a photoisomerization (PI) layer, where the PI layer comprises molecules configured to physically deform in response to external stimuli;
forming an excitonic layer on the PI layer to form an anti-tampering module, where the excitonic layer is comprised of material that exhibit excitonic properties and the anti-tampering module is arranged inside an electronic device;
changing optical band gap of the excitonic layer in select regions thereof by physically deforming select regions of the PI layer such that select regions of the excitonic layer are adjacent to select regions of PI layer; and
inducing photoluminescence from the excitonic layer after the step of changing the optical band gap; and
monitoring the photoluminescence from the excitonic layer, thereby detecting tampering with the electronic device.
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