US 12,406,353 B2
Systems and methods for defect detection on displays
Stephen Tate DiJoseph, Downingtown, PA (US); and Garret Yoder, Exton, PA (US)
Assigned to Communications Test Design, Inc., West Chester, PA (US)
Filed by Communications Test Design, Inc., West Chester, PA (US)
Filed on Dec. 22, 2022, as Appl. No. 18/087,312.
Prior Publication US 2024/0212127 A1, Jun. 27, 2024
Int. Cl. G06T 7/00 (2017.01); G06T 11/20 (2006.01); G06V 10/56 (2022.01); G09G 3/00 (2006.01); G09G 5/02 (2006.01)
CPC G06T 7/0008 (2013.01) [G06T 11/203 (2013.01); G06V 10/56 (2022.01); G09G 3/006 (2013.01); G09G 5/02 (2013.01)] 42 Claims
OG exemplary drawing
 
1. A method for detecting defects on an electronic device display comprising:
connecting an electronic device to a server computer having a processor and a non-transitory computer readable storage medium storing test software for testing the electronic device display;
displaying an outline on the electronic device display, wherein the outline traces a perimeter of the electronic device display, and wherein the outline comprises pixels of a first color, the first color differing from a color of a pixel that is not on the perimeter of the electronic device display;
capturing a digital image of the electronic device while the electronic device is displaying the outline;
transmitting the digital image to the server computer;
analyzing the digital image at the server computer by performing the steps of:
selecting a first edge pixel on a first edge of a perimeter of the digital image and iterating pixel by pixel towards an interior pixel of the digital image until a first pixel of the digital image comprising the first color (“P1”) is found;
selecting a second pixel of the digital image (“P2”) wherein P2 is adjacent to P1 and P2 is of the first color;
changing P2 to a second color different from the first color;
selecting a third pixel of the digital image (“P3”) wherein P3 is adjacent to P2, P3 is of the first color, and P3 is different than P1;
iterating the digital image pixel by pixel from P1 to P3 along a path comprising only pixels of the first color;
determining that a defect exists on the electronic device display if no continuous path exists between P1 and P3 comprising only pixels of the first color.
 
24. A method for detecting defects on an electronic device display comprising:
connecting an electronic device to a server computer having a processor and a non-transitory computer readable storage medium storing test software for testing the electronic device display;
displaying an outline on the electronic device display, wherein the outline traces a perimeter of the electronic device display, and wherein the outline comprises pixels of a first color, the first color differing from a color of a pixel that is not on the perimeter of the electronic device display;
capturing a digital image of the electronic device while the electronic device is displaying the outline;
transmitting the digital image to the server computer;
analyzing the digital image at the server computer by performing the steps of:
selecting a first edge pixel on a first edge of a perimeter of the digital image and iterating pixel by pixel towards an interior pixel of the digital image until a first pixel of the digital image comprising the first color (“P1”) is found;
selecting a second pixel of the digital image (“P2”) wherein P2 is adjacent to P1 and P2 is of the first color;
iterating the digital image pixel by pixel from P1 to P2 along a path comprising only pixels of the first color;
determining that a defect exists in the electronic device display if no continuous path exists between P1 and P2 comprising only pixels of the first color.