US 12,406,127 B2
Static timing analysis of multi-die three-dimensional integrated circuits
Subramanyam Sripada, Portland, OR (US); and Song Chen, San Jose, CA (US)
Assigned to Synopsys, Inc., Sunnyvale, CA (US)
Filed by Synopsys, Inc., Mountain View, CA (US)
Filed on Mar. 25, 2022, as Appl. No. 17/705,145.
Prior Publication US 2023/0306180 A1, Sep. 28, 2023
Int. Cl. G06F 30/398 (2020.01); G06F 1/12 (2006.01)
CPC G06F 30/398 (2020.01) [G06F 1/12 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A computer-implemented method for timing analysis of three-dimensional integrated circuits (3DICs), comprising:
receiving a circuit design for a 3DIC, the circuit design targeted for implementation on a stacked die comprising a plurality of dies, the circuit design comprising a plurality of portions of the circuit design, each portion of the circuit design targeted for a die from the plurality of dies;
selecting a first portion of the circuit design targeted for implementation on a first die and a second portion of the circuit design targeted for implementation on a second die, the circuit design including a set of nets that cross die boundaries, such that each net of the set of nets includes a first timing node in the first portion of the circuit design and a second timing node in the second portion of the circuit design;
selecting a net from the set of nets that cross die boundaries, the net providing signal to one or more load pins;
for each of a plurality of corners associated with the second die:
determining a plurality of sets of timing values of the net, each set of timing values corresponding to a corner associated with the first die;
determining a worst case slack value for the net based on the plurality of sets of timing values; and
determining a timing adjustment value for each load pin of the net based on aggregate timing values determined from the plurality of sets of timing values; and
adjusting the worst case slack value based on the timing adjustment value for the net to reduce pessimism of the worst case slack value.