US 12,405,306 B2
Self-diagnosis circuit and semiconductor device
Ryosuke Sumii, Kyoto (JP); Katsuhiro Oshikawa, Kyoto (JP); and Takayuki Matsuura, Kyoto (JP)
Assigned to Rohm Co., Ltd., Kyoto (JP)
Appl. No. 18/272,432
Filed by Rohm Co., Ltd., Kyoto (JP)
PCT Filed Jan. 12, 2022, PCT No. PCT/JP2022/000689
§ 371(c)(1), (2) Date Jul. 14, 2023,
PCT Pub. No. WO2022/158347, PCT Pub. Date Jul. 28, 2022.
Claims priority of application No. 2021-006876 (JP), filed on Jan. 20, 2021.
Prior Publication US 2024/0175922 A1, May 30, 2024
Int. Cl. G01R 31/3187 (2006.01); G01R 31/28 (2006.01); G01R 31/319 (2006.01); G01R 31/3193 (2006.01)
CPC G01R 31/3187 (2013.01) [G01R 31/2856 (2013.01); G01R 31/2879 (2013.01); G01R 31/31901 (2013.01); G01R 31/31932 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A self-diagnosis circuit configured to diagnose a fault detection circuit that includes a first comparator configured to be fed with a voltage based on a fault sensing target voltage and a first reference voltage comprising:
a voltage switch circuit configured to switch a level of a voltage based on a second reference voltage and output a resulting voltage;
a first path switch circuit configured to switch between a path through which a voltage output from the voltage switch circuit is fed to the first comparator and a path through which the voltage based on the fault sensing target voltage is fed to the first comparator; and
a control circuit configured to control the voltage switch circuit and the path switch circuit.