US 12,405,235 B2
Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage medium
Hideo Toraya, Akishima (JP)
Assigned to RIGAKU CORPORATION, Tokyo (JP)
Filed by Rigaku Corporation, Tokyo (JP)
Filed on Nov. 13, 2023, as Appl. No. 18/507,147.
Claims priority of application No. 2022-182119 (JP), filed on Nov. 14, 2022.
Prior Publication US 2024/0167969 A1, May 23, 2024
Int. Cl. G01N 23/2055 (2018.01); G01N 23/207 (2018.01)
CPC G01N 23/2055 (2013.01) [G01N 23/207 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/60 (2013.01)] 11 Claims
OG exemplary drawing
 
1. A degree-of-crystallinity measurement apparatus, comprising:
an X-ray scattering pattern acquirer configured to acquire an X-ray scattering pattern of a sample including a crystalline portion and an amorphous portion of a target substance;
a pattern decomposer configured to acquire a diffraction pattern of the crystalline portion and a continuous pattern from the X-ray scattering pattern;
a target substance intensity calculator configured to calculate an integrated intensity of the target substance based on the X-ray scattering pattern and chemical formula information of the target substance;
a target substance pattern calculator configured to calculate, from the continuous pattern, a scattering pattern of the target substance including the crystalline portion and the amorphous portion so that an integrated intensity of the target substance matches the integrated intensity calculated by the target substance intensity calculator;
a structural disorder parameter determiner configured to determine a structural disorder parameter of the crystalline portion based on the diffraction pattern of the crystalline portion and the scattering pattern of the target substance; and
a degree-of-crystallinity output device configured to output a degree of crystallinity of the target substance calculated based on the determined structural disorder parameter.