CPC C23C 14/0676 (2013.01) [C23C 14/35 (2013.01)] | 14 Claims |
1. A method for forming an oxide phase-containing chromium nitride thin film, comprising:
cleaning a substrate by sonicating with acetone and/or isopropyl alcohol;
reactive radio frequency magnetron sputtering chromium onto the substrate in the presence of a gaseous mixture comprising nitrogen, oxygen and argon to form the chromium nitride thin film which comprises a CrOxNy phase, wherein:
a ratio of the nitrogen gas to the argon gas is 1:2 to 1:10,
the chromium nitride thin film has an average thickness of 500 to 1500 nm,
the chromium is sputtered with a sputtering power of 120-150 W,
a flow rate of the nitrogen gas is from 1 sccm to 4 sccm, and
the chromium nitride film grows in [111]CrN and [002]CrN directions by X-ray diffraction (XRD).
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