US 12,404,114 B2
Correction techniques for material classification
Lakshmi Chellappan, Markle, IN (US); Manuel Gerardo Garcia, Jr., Austin, TX (US); Hoang Triet Giang Le, Fort Wayne, IN (US); and Casey Hughlett, Fort Wayne, IN (US)
Assigned to SORTERA TECHNOLOGIES, INC., Markle, IN (US)
Filed by Sortera Technologies Inc., Markle, IN (US)
Filed on Oct. 20, 2023, as Appl. No. 18/491,692.
Claims priority of provisional application 63/478,823, filed on Jan. 6, 2023.
Claims priority of provisional application 63/418,242, filed on Oct. 21, 2022.
Prior Publication US 2024/0133830 A1, Apr. 25, 2024
Prior Publication US 2024/0228181 A9, Jul. 11, 2024
Int. Cl. G06V 10/20 (2022.01); B07C 5/342 (2006.01); B07C 5/346 (2006.01); B65G 43/08 (2006.01); G01N 23/223 (2006.01); G06V 10/764 (2022.01)
CPC B65G 43/08 (2013.01) [B07C 5/342 (2013.01); B07C 5/346 (2013.01); G01N 23/223 (2013.01); G06V 10/255 (2022.01); G06V 10/764 (2022.01); B65G 2203/044 (2013.01); B65G 2811/0673 (2013.01); G01N 2223/643 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
conveying a material piece on a moving conveyor belt past an x-ray fluorescence (“XRF”) system;
irradiating the material piece with an x-ray beam emitted by the XRF system;
measuring an XRF spectrum of the material piece resulting from the irradiation of the material piece with the x-ray beam;
determining an area of intersection between an x-ray beam spot of the irradiated x-ray beam and the material piece;
modifying the measured XRF spectrum of the material piece as a function of the determined area of intersection; and
classifying the material piece as a function of the modified XRF spectrum.