CPC B32B 17/10119 (2013.01) [B32B 17/10513 (2013.01); B32B 17/1099 (2013.01); C23C 14/086 (2013.01); G02B 1/18 (2015.01); G02F 1/1523 (2013.01); G02F 1/1533 (2013.01); G02F 1/155 (2013.01); H01B 13/00 (2013.01); G02F 1/153 (2013.01); G02F 2001/1536 (2013.01); Y10T 29/49126 (2015.01)] | 14 Claims |
1. A method of cutting an optical device laminate, the method comprising, in order:
receiving an optical device assembly comprising a first substrate with a plurality of electrochromic stacks disposed thereon;
testing at least some of the plurality of electrochromic stacks to find defects;
mitigating at least some of the found defects;
laminating a second substrate onto the first substrate to form an optical device laminate; and
cutting, using a laser, the optical device laminate into a plurality of optical device lites.
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