US 12,402,857 B2
Electronic device
Shunpei Yamazaki, Setagaya (JP); Koji Kusunoki, Isehara (JP); Kazunori Watanabe, Machida (JP); and Tatsunori Inoue, Yamato (JP)
Assigned to Semiconductor Energy Laboratory Co., Ltd., Atsugi (JP)
Appl. No. 18/281,654
Filed by Semiconductor Energy Laboratory Co., Ltd., Atsugi (JP)
PCT Filed Mar. 28, 2022, PCT No. PCT/IB2022/052789
§ 371(c)(1), (2) Date Sep. 12, 2023,
PCT Pub. No. WO2022/214905, PCT Pub. Date Oct. 13, 2022.
Claims priority of application No. 2021-065754 (JP), filed on Apr. 8, 2021.
Prior Publication US 2024/0173014 A1, May 30, 2024
Int. Cl. A61B 8/10 (2006.01); A61B 3/12 (2006.01); A61B 8/06 (2006.01); G02B 27/01 (2006.01); G06T 19/00 (2011.01)
CPC A61B 8/10 (2013.01) [A61B 3/12 (2013.01); A61B 8/06 (2013.01); G02B 27/017 (2013.01); G06T 19/006 (2013.01)] 7 Claims
OG exemplary drawing
 
1. An electronic device comprising:
a display portion comprising a first region and a second region; and
a sensor portion over the display portion,
wherein the first region comprises a first light-emitting device,
wherein the second region comprises a second light-emitting device and a light-receiving device,
wherein the sensor portion comprises a diamond layer,
wherein the sensor portion and the second region overlap each other,
wherein the electronic device further comprises a wall between the first light-emitting device and the second light-emitting device,
wherein, when first light from the second light-emitting device enters the sensor portion, second light from the sensor portion enters to the light-receiving device, and
wherein the electronic device is configured to measure a temperature from an intensity of the second light.