US 12,075,702 B2
Conductive particle interconnect switch
Matthew Doyle, Chatfield, MN (US); Joseph Kuczynski, North Port, FL (US); Patrick Egan, Rochester, MN (US); Jeffrey N. Judd, Oronoco, MN (US); and Timothy J. Tofil, Rochester, MN (US)
Assigned to International Business Machines Corporation, Armonk, NY (US)
Filed by International Business Machines Corporation, Armonk, NY (US)
Filed on Jul. 8, 2022, as Appl. No. 17/811,374.
Application 17/811,374 is a division of application No. 16/415,949, filed on May 17, 2019, granted, now 11,411,166.
Prior Publication US 2022/0344569 A1, Oct. 27, 2022
Int. Cl. H01L 41/04 (2006.01); H01H 1/029 (2006.01); H01H 57/00 (2006.01); H10N 30/20 (2023.01); H10N 30/857 (2023.01)
CPC H10N 30/20 (2023.02) [H01H 1/029 (2013.01); H01H 57/00 (2013.01); H10N 30/857 (2023.02)] 14 Claims
OG exemplary drawing
 
1. A method comprising:
determining a target state of a conductive particle interconnect (CPI), wherein the CPI includes an elastomeric carrier having an electroactive polymer (EAP) configured to move between a first position and a second position in response to application of an electrical field, the CPI further including a plurality of conductive particles, wherein the second position is associated with the target state;
generating an input signal based on the target state;
transmitting the input signal to a voltage source to cause the voltage source to apply the electrical field to the EAP to move the EAP to the second position;
monitoring, after transmitting the input signal to the voltage source, an output of the CPI, wherein monitoring the output of the CPI includes determining a resistance of the CPI;
determining, based on the monitoring, whether the CPI is in the target state; and
adjusting, in response to determining that the CPI is not in the target state, a voltage applied to the EAP, wherein the adjusting includes:
in response to the resistance of the CPI being too high, decreasing the voltage applied to the EAP to cause further compression of the CPI; and
in response to the resistance of the CPI being too low, increasing the voltage applied to the EAP to reduce compression of the CPI.