CPC H04N 25/77 (2023.01) [H04N 25/75 (2023.01)] | 16 Claims |
1. An image sensor, comprising:
a pixel array including a plurality of pixels;
wherein each pixel in the pixel array is formed in a portion of a substrate electrically insulated from other portions of the substrate;
wherein each pixel comprises: a photodetector; a transfer transistor; and a readout circuit comprising one or more transistors;
wherein the one or more transistors of the readout circuit are formed inside and on top of at least one well of said portion;
wherein at least one transistor of the readout circuit of a pixel of at least one previous row is configured for reading from the photodetector of a pixel of a current row;
wherein the well of the pixel of the at least one previous row is biased at a first bias voltage; and
wherein the well of the pixel of the current row is biased at a second bias voltage, the first bias voltage being greater than the second bias voltage.
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