US 12,073,964 B2
Laminate structure, cable and tube
Seiichi Kashimura, Tokyo (JP); Kazufumi Suenaga, Tokyo (JP); Tamotsu Kibe, Tokyo (JP); and Kanako Suganuma, Tokyo (JP)
Assigned to Proterial, Ltd., Tokyo (JP)
Filed by Hitachi Metals, Ltd., Tokyo (JP)
Filed on Feb. 7, 2022, as Appl. No. 17/666,190.
Claims priority of application No. 2021-019099 (JP), filed on Feb. 9, 2021; and application No. 2021-098350 (JP), filed on Jun. 11, 2021.
Prior Publication US 2022/0254543 A1, Aug. 11, 2022
Int. Cl. H01B 7/17 (2006.01); C09D 5/32 (2006.01); C09D 7/61 (2018.01); C09D 183/00 (2006.01)
CPC H01B 7/17 (2013.01) [C09D 5/32 (2013.01); C09D 7/61 (2018.01); C09D 183/00 (2013.01)] 19 Claims
OG exemplary drawing
 
1. A laminate structure comprising:
a first layer as a substrate; and
a second layer being provided on the first layer and comprising a rubber composition including a rubber component, first fine particles for providing a surface with irregularity, and second fine particles for shielding UV-C light,
wherein an average particle size of the second fine particles is smaller than an average particle size of the first fine particles,
wherein the average particle size of the first fine particles is 1 μm or more and 10 μm or less,
wherein the average particle size of the second fine particles is 10 nm or more and 1 μm or less,
wherein when performing Raman mapping analysis on a first peak derived from oscillation of the second fine particles in Raman scattering spectrum obtained by Raman scattering measurement of the second layer, the second layer includes a region where an intensity of the first peak is greater in an area where the first fine particles are not present than an area where the first fine particles are present,
wherein the first layer includes first TiO2 fine particles, and the second fine particles of the second layer include TiO2 fine particles,
wherein a Ti concentration of the first layer is 0.35 mass % or more and 3.0 mass % or less, and a Ti concentration of the second layer is 1.0 mass % or more and 4.4 mass % or less, and
wherein a Ti concentration of the second layer is higher than a Ti concentration of the first layer.