US 12,073,535 B2
Method of processing an EDX/XRF map and a corresponding image processing device
Thomas Schwager, Berlin (DE)
Assigned to BRUKER NANO GMBH, Berlin (DE)
Filed by Bruker Nano GmbH, Berlin (DE)
Filed on Dec. 15, 2021, as Appl. No. 17/644,558.
Claims priority of application No. 20215631 (EP), filed on Dec. 18, 2020.
Prior Publication US 2022/0198626 A1, Jun. 23, 2022
Int. Cl. G06T 5/20 (2006.01)
CPC G06T 5/20 (2013.01) 15 Claims
OG exemplary drawing
 
1. A method of processing an energy-dispersive X-ray (EDX)/X-ray fluorescence (XRF) map (1), comprising the steps:
select a data point (dp) among a plurality of data points of the EDX/XRF map (1), wherein each of the data points comprise a local measured value (m) and a local dispersion value (v) of a measured variable;
compare the local measured value (m) of the selected data point (dp) with a local threshold value (th), the local threshold value (th) based on the local dispersion value (v) of the selected data point (dp);
determine a first modified mean value (M[1]) based on the local measured value (m) of the selected data point (dp) and the local measured value of at least one neighboring data point neighboring the selected data point (dp), and
determine a first modified dispersion value (V[1]) based on the local dispersion value (v) of the selected data point (dp) and the dispersion value of the at least one neighboring data point,
both when the local measured value (m) of the selected data point (dp) is below the local threshold value (th);
compare the first modified mean value (M[1]) with a first modified threshold value (TH[1]) based on the first modified dispersion value (V[1]); and
replace the local measured value (m) of the selected data point (dp) by the first modified mean value (M[1]), when the first modified mean value (M[1]) is above the first modified threshold value (TH[1]).