US 12,072,302 B2
X-ray phase imaging system
Bunta Matsuhana, Kyoto (JP); Yuto Maeda, Kyoto (JP); Jiro Masuda, Kyoto (JP); Kana Kojima, Kyoto (JP); and Takahiro Doki, Kyoto (JP)
Assigned to Shimadzu Corporation, Kyoto (JP)
Filed by Shimadzu Corporation, Kyoto (JP)
Filed on Oct. 31, 2022, as Appl. No. 17/977,011.
Claims priority of application No. 2021-206399 (JP), filed on Dec. 20, 2021; and application No. 2022-083847 (JP), filed on May 23, 2022.
Prior Publication US 2023/0194441 A1, Jun. 22, 2023
Int. Cl. G01N 23/041 (2018.01); A61B 6/00 (2024.01); A61B 6/10 (2006.01); A61B 6/42 (2024.01)
CPC G01N 23/041 (2018.02) [A61B 6/102 (2013.01); A61B 6/484 (2013.01); A61B 6/4291 (2013.01)] 14 Claims
OG exemplary drawing
 
1. An X-ray phase imaging system comprising:
an X-ray source that irradiates a subject with X-rays;
a detector that detects the X-rays emitted from the X-ray source;
a plurality of gratings that are disposed between the X-ray source and the detector, and that include a first grating which is irradiated with the X-rays from the X-ray source and a second grating which is irradiated with X-rays from the first grating; and
an imaging unit that optically images the subject and one or both of the first grating and the second grating.