US 12,070,625 B2
Systems, devices, and methods for high quality ion beam formation
Alexander Dunaevsky, Corona, CA (US); Artem N. Smirnov, Mission Viejo, CA (US); Alexandr A. Ivanov, Novosibirsk (RU); and Vladislav Vekselman, Lake Forest, CA (US)
Assigned to TAE TECHNOLOGIES, INC., Foothill Ranch, CA (US)
Filed by TAE TECHNOLOGIES, INC., Foothill Ranch, CA (US)
Filed on Nov. 10, 2022, as Appl. No. 17/984,954.
Application 17/984,954 is a continuation of application No. 17/006,080, filed on Aug. 28, 2020, granted, now 11,524,179.
Claims priority of provisional application 63/044,310, filed on Jun. 25, 2020.
Claims priority of provisional application 62/895,203, filed on Sep. 3, 2019.
Claims priority of provisional application 62/894,220, filed on Aug. 30, 2019.
Claims priority of provisional application 62/894,106, filed on Aug. 30, 2019.
Claims priority of provisional application 62/894,290, filed on Aug. 30, 2019.
Prior Publication US 2023/0249002 A1, Aug. 10, 2023
Int. Cl. A61N 5/10 (2006.01); H05H 5/03 (2006.01); H05H 5/06 (2006.01)
CPC A61N 5/1077 (2013.01) [A61N 5/1048 (2013.01); H05H 5/03 (2013.01); H05H 5/063 (2013.01); A61N 2005/109 (2013.01); A61N 2005/1095 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A beam system, comprising:
a particle source configured to emit a charged particle beam;
a pre-accelerator system configured to accelerate the charged particle beam from the particle source;
an accelerator configured to accelerate the charged particle beam from the pre-accelerator system;
a first vacuum pump chamber positioned between the pre-accelerator system and the accelerator, wherein the first vacuum pump chamber is configured to remove gas exiting the accelerator into the pre-accelerator system; and
a second vacuum pump chamber positioned between the particle source and the pre-accelerator system.