US 11,741,866 B2
Display device and pad contact test method thereof
Wontae Kim, Hwaseong-si (KR); Myeongsu Kim, Hwaseong-si (KR); Boyeon Kim, Seoul (KR); Jae-Han Lee, Hwaseong-si (KR); and Whee-Won Lee, Hwaseong-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do (KR)
Filed by Samsung Display Co., Ltd., Yongin-Si (KR)
Filed on Jul. 30, 2021, as Appl. No. 17/389,627.
Claims priority of application No. 10-2020-0166057 (KR), filed on Dec. 1, 2020.
Prior Publication US 2022/0172653 A1, Jun. 2, 2022
Int. Cl. G09G 3/00 (2006.01); H01L 27/32 (2006.01); H10K 59/131 (2023.01)
CPC G09G 3/006 (2013.01) [H10K 59/131 (2023.02)] 20 Claims
OG exemplary drawing
 
1. A display device comprising:
a display panel;
a main circuit board comprising a plurality of board pads arranged along a first direction;
a connection circuit board electrically connected to the display panel on one side thereof and electrically connected to the main circuit board on another side thereof; and
a driving chip disposed on the connection circuit board,
wherein the connection circuit board comprises:
a plurality of board connection pads respectively connected to the board pads;
a plurality of lines connecting the board connection pads and the driving chip to each other; and
a test pattern disposed spaced apart from the driving chip, and
wherein a first line and a second line among the lines are electrically connected to driving pads of the driving chip, and are electrically connected to the test pattern via the driving pads of the driving chip, and
wherein a same voltage is applied to the first line and the second line.