US 11,741,113 B2
Measurement guide device and simulation computing device used therefor
Takuya Kanazawa, Tokyo (JP); and Akinori Asahara, Tokyo (JP)
Assigned to HITACHI, LTD., Tokyo (JP)
Appl. No. 17/413,040
Filed by Hitachi, Ltd., Tokyo (JP)
PCT Filed Jan. 23, 2020, PCT No. PCT/JP2020/002319
§ 371(c)(1), (2) Date Jun. 11, 2021,
PCT Pub. No. WO2020/166300, PCT Pub. Date Aug. 20, 2020.
Claims priority of application No. 2019-023370 (JP), filed on Feb. 13, 2019.
Prior Publication US 2022/0027364 A1, Jan. 27, 2022
Int. Cl. G06F 16/24 (2019.01); G06F 16/2458 (2019.01); G01N 23/20 (2018.01)
CPC G06F 16/2458 (2019.01) [G01N 23/20 (2013.01)] 5 Claims
OG exemplary drawing
 
1. A measurement guide system for proposing a next measurement point on a basis of obtained measurement results, the measurement guide system comprising:
a memory;
at least one processor, coupled to said memory, and operative to perform operations comprising:
irradiating, by a measurement device, a metal with a neutron beam and a detector configured to detect scattered neurons;
storing, by a first database, virtual measured signals and storing, by a second database, measurement procedures that are obtained by simulation;
a first computer programmed to generate the virtual measured signals of virtual specimens to store in the first database by a simulation, and to generate measurement procedures for each virtual specimen to store in the second database; and
a second computer coupled to the measurement device, first database, second database and first computer,
wherein the measurement device executes irradiation of the metal with the neutron beam to generate a scattering intensity of detected neutrons as measurement results, which is stored in the second computer, the measurement results including a wavenumber and corresponding scattering intensity,
wherein the second computer is programmed to:
extract, from the first database, virtual measured signals similar to the measurement results obtained by the measurement device, and, from the second database, measurement procedures regarding the virtual measured signals, and
select at least one measurement procedure from the measurement procedures obtained by the similarity search section, determining the next measurement point, and
wherein the measurement device executes measurement of the metal at the determined next measurement point.