US 11,740,270 B2
Pattern generator and built-in-self test device including the same
Juyun Lee, Suwon-si (KR); Hanseok Kim, Seoul (KR); Jiyoung Kim, Osan-si (KR); Jaehyun Park, Seoul (KR); Hyeonju Lee, Hwaseong-si (KR); Kangjik Kim, Hwaseong-si (KR); Sunggeun Kim, Hwaseong-si (KR); Seuk Son, Seoul (KR); Hobin Song, Daejeon (KR); and Nakwon Lee, Seoul (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Sep. 13, 2022, as Appl. No. 17/943,551.
Claims priority of application No. 10-2021-0122066 (KR), filed on Sep. 13, 2021.
Prior Publication US 2023/0099986 A1, Mar. 30, 2023
Int. Cl. G01R 25/04 (2006.01); H03L 7/085 (2006.01); H03L 7/08 (2006.01)
CPC G01R 25/04 (2013.01) [H03L 7/085 (2013.01); H03L 7/0807 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus for generating an output signal having a waveform that is repeated every period, the apparatus comprising:
a storage configured to store values corresponding to the waveform in a portion of a period of the output signal;
a counter configured to generate a first index of a sample included in the output signal;
a controller configured to generate at least one control signal based on the first index and the period of the output signal; and
a calculation circuit configured to generate the output signal by calculating an output from the storage based on the at least one control signal.