US 11,737,705 B2
Implant installation strength evaluation method, implant installation strength evaluation device, and program
Daisuke Nakashima, Tokyo (JP); Takeo Nagura, Tokyo (JP); Masaharu Nishikino, Kyoto (JP); Noboru Hasegawa, Kyoto (JP); Katsuhiro Mikami, Kyoto (JP); Toshiyuki Kitamura, Kyoto (JP); Shuji Kondo, Kyoto (JP); Hajime Okada, Kyoto (JP); and Yoshinori Shimada, Osaka (JP)
Assigned to KEIO UNIVERSITY, Tokyo (JP); and NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECHNOLOGY, Chiba (JP)
Appl. No. 16/647,069
Filed by KEIO UNIVERSITY, Tokyo (JP); and NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECHNOLOGY, Chiba (JP)
PCT Filed Sep. 13, 2018, PCT No. PCT/JP2018/033978
§ 371(c)(1), (2) Date Mar. 13, 2020,
PCT Pub. No. WO2019/054442, PCT Pub. Date Mar. 21, 2019.
Claims priority of application No. 2017-177109 (JP), filed on Sep. 14, 2017.
Prior Publication US 2020/0205730 A1, Jul. 2, 2020
Int. Cl. A61B 5/00 (2006.01); A61C 8/00 (2006.01); A61F 2/46 (2006.01); G01N 3/06 (2006.01)
CPC A61B 5/4851 (2013.01) [A61B 5/0051 (2013.01); A61B 5/0088 (2013.01); A61C 8/009 (2013.01); A61F 2/4657 (2013.01); G01N 3/068 (2013.01); A61B 2562/0219 (2013.01); A61F 2002/4666 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An implant installation strength evaluation method comprising:
a step of vibrating an implant when the implant is irradiated with a laser beam;
a step of measuring time series data of the number of vibrations and vibration strengths of the implant vibrated in the vibrating step; and
a step of deriving information indicating an index of an installation strength of the implant based on the time series data of the number of vibrations and the vibration strengths of the implant.