US 12,398,469 B2
Methods and systems for producing conformal thin films
Alain E. Kaloyeros, Slingerlands, NY (US); and Barry C. Arkles, Pipersville, PA (US)
Assigned to KALARK NANOSTRUCTURE SCIENCES INC., Doylestown, PA (US)
Filed by KALARK NANOSTRUCTURE SCIENCES INC., Doylestown, PA (US)
Filed on Nov. 22, 2024, as Appl. No. 18/956,091.
Claims priority of provisional application 63/601,966, filed on Nov. 22, 2023.
Prior Publication US 2025/0163584 A1, May 22, 2025
Int. Cl. C23C 28/02 (2006.01); C23C 14/34 (2006.01); C23C 16/455 (2006.01)
CPC C23C 28/02 (2013.01) [C23C 14/3407 (2013.01); C23C 16/45525 (2013.01)] 28 Claims
OG exemplary drawing
 
1. A physico-chemical method for depositing a conformal layer on a substrate, comprising:
providing a substrate in a reactor;
heating the substrate to a temperature of about 100° C. to about 650° C.;
maintaining the substrate at about 100° C. to about 650° C.,
providing a sputtering target in the reactor;
introducing a chemical species into the reactor in the vapor phase above the substrate and/or on a substrate surface;
wherein the chemical species is selected from the group consisting of diolefins, carbon monoxide, nitrogen monoxide, tertiary phosphines, tertiary amines, diketonates, hydrazine, dimethylhydrazine, and hydrazoic acid;
ejecting single atoms or multi-atom clusters comprising up to three atoms from the sputtering target;
causing the ejected single atoms or multi-atom clusters to interact with the chemical species in the vapor phase above the substrate and/or on the substrate surface;
wherein the interaction forms a complex in the vapor phase and/or on the substrate surface;
wherein the formation of the complex is due to or enabled by an energy transfer process, a remote or direct plasma application process, electron ionization, oxidation, and/or reduction;
wherein the complex has a sticking coefficient S and a probability of desorption Pd whose sum is about 0.01 to about 0.9; and
forming a conformal layer from the complex on the substrate surface, wherein the conformal layer has the same elemental composition as the sputtering target.