US 12,069,710 B2
Method and apparatus of beam management with measurement aging
Ahmad AlAmmouri, Garland, TX (US); Jianhua Mo, Allen, TX (US); Vutha Va, Plano, TX (US); and Boon Loong Ng, Plano, TX (US)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Jan. 31, 2022, as Appl. No. 17/589,702.
Claims priority of provisional application 63/230,487, filed on Aug. 6, 2021.
Prior Publication US 2023/0042556 A1, Feb. 9, 2023
Int. Cl. H04W 72/54 (2023.01); H04W 72/044 (2023.01); H04W 72/542 (2023.01)
CPC H04W 72/542 (2023.01) [H04W 72/044 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for operating an electronic device, the method comprising:
obtaining information about signal quality measurements associated with a channel;
generating newly obtained signal quality measurements based on a beam-sweeping procedure, wherein each signal quality measurement is associated with a respective measurement time and a respective transmit beam;
adjusting the newly obtained signal quality measurements based on the measurement times and positional information of the electronic device; and
updating a first measurement database of signal quality measurements with the adjusted signal quality measurements.