CPC H01L 29/41791 (2013.01) [H01L 21/823807 (2013.01); H01L 21/823814 (2013.01); H01L 21/823821 (2013.01); H01L 27/0924 (2013.01); H01L 29/66795 (2013.01); H01L 29/7851 (2013.01); H03K 19/0948 (2013.01)] | 32 Claims |
1. A transistor comprising:
a substrate;
a pair of constant current forming regions provided in the substrate;
a pair of source/drain regions respectively provided on the pair of constant current forming regions in the substrate; and
a gate structure provided between the pair of source/drain regions,
wherein any one of the constant current forming regions immediately adjacent to any one of the pair of source/drain regions serving as a drain forms a constant current between the any one of the pair of source/drain region serving as the drain and the any one of the constant current forming regions,
wherein the substrate and the pair of constant current forming regions have a first conductivity type,
the pair of source/drain regions have a second conductivity type different from the first conductivity type, and
a doping concentration of the pair of constant current forming regions is higher than a doping concentration of the substrate.
|