US 12,067,258 B2
Memory device and program speed control method thereof
Hyun Seob Shin, Icheon-si (KR); and Dong Hun Kwak, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Oct. 10, 2022, as Appl. No. 17/962,645.
Claims priority of application No. 10-2022-0053085 (KR), filed on Apr. 28, 2022.
Prior Publication US 2023/0350576 A1, Nov. 2, 2023
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0619 (2013.01) [G06F 3/0629 (2013.01); G06F 3/0673 (2013.01)] 23 Claims
OG exemplary drawing
 
18. A method of operating a memory device, the method comprising:
designating a plurality of memory cell groups including a predetermined number of memory cells having successive physical column addresses;
applying program voltages increasing gradually to the plurality of memory cell groups through word lines;
determining application times of program permission voltages applied to the plurality of memory cell groups, respectively, and magnitudes of the program permission voltages on the basis of a magnitude of the program voltages; and
applying the program permission voltages to the plurality of memory cell groups through bit lines.