US 12,067,253 B2
Opportunistic background data integrity scans
Karl D. Schuh, Santa Cruz, CA (US); and William Richard Akin, Morgan Hill, CA (US)
Assigned to MICRON TECHNOLOGY, INC., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Feb. 7, 2022, as Appl. No. 17/666,087.
Prior Publication US 2023/0251779 A1, Aug. 10, 2023
Int. Cl. G06F 12/00 (2006.01); G06F 3/06 (2006.01)
CPC G06F 3/0619 (2013.01) [G06F 3/0604 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method comprising:
determining, using a memory request queue, that a memory component to be subjected to a background data integrity scan does not currently satisfy an activity threshold;
delaying the background data integrity scan in response to determining the memory component does not satisfy the activity threshold;
detecting a background data integrity scan trigger event; and
performing the background data integrity scan in response to trigger event.