US 12,066,328 B2
Photothermal infrared spectroscopy utilizing spatial light manipulation
Derek Decker, Santa Barbara, CA (US); and Craig Prater, Santa Barbara, CA (US)
Assigned to Photothermal Spectroscopy Corp., Santa Barbara, CA (US)
Filed by Photothermal Spectroscopy Corp., Santa Barbara, CA (US)
Filed on Sep. 28, 2022, as Appl. No. 17/955,122.
Application 17/955,122 is a continuation of application No. 16/427,866, filed on May 31, 2019, granted, now 11,486,761.
Claims priority of provisional application 62/679,554, filed on Jun. 1, 2018.
Prior Publication US 2023/0131208 A1, Apr. 27, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01J 3/02 (2006.01); G01J 3/10 (2006.01)
CPC G01J 3/0297 (2013.01) [G01J 3/0216 (2013.01); G01J 3/0229 (2013.01); G01J 3/108 (2013.01); G01J 2003/102 (2013.01)] 29 Claims
OG exemplary drawing
 
1. An apparatus for rapidly characterizing a sample with infrared radiation on a submicron scale, the apparatus comprising:
a source of infrared radiation configured to illuminate the sample with a beam of infrared radiation to create an infrared illuminated area;
a source of probe radiation configured to illuminate the sample with a beam of probe radiation to create a probe illuminated area;
a collector configured to collect as collected probe light at least a portion of probe radiation that has interacted with the sample;
at least one detector configured to detect as detected probe light at least a portion of collected probe light and generate at least one signal indicative of the portion of collected probe light;
at least one spatial light manipulator configured to alter a distribution of collected probe light incident on the at least one detector, wherein the at least one signal is used to generate a signal indicative of an absorption of infrared radiation of at least a portion of a region of the infrared illuminated area; and
wherein the source of infrared radiation and the source of probe radiation are configured such that the infrared illuminated area can interact with a sample to affect the detected probe light.