CPC G01J 3/0297 (2013.01) [G01J 3/0216 (2013.01); G01J 3/0229 (2013.01); G01J 3/108 (2013.01); G01J 2003/102 (2013.01)] | 29 Claims |
1. An apparatus for rapidly characterizing a sample with infrared radiation on a submicron scale, the apparatus comprising:
a source of infrared radiation configured to illuminate the sample with a beam of infrared radiation to create an infrared illuminated area;
a source of probe radiation configured to illuminate the sample with a beam of probe radiation to create a probe illuminated area;
a collector configured to collect as collected probe light at least a portion of probe radiation that has interacted with the sample;
at least one detector configured to detect as detected probe light at least a portion of collected probe light and generate at least one signal indicative of the portion of collected probe light;
at least one spatial light manipulator configured to alter a distribution of collected probe light incident on the at least one detector, wherein the at least one signal is used to generate a signal indicative of an absorption of infrared radiation of at least a portion of a region of the infrared illuminated area; and
wherein the source of infrared radiation and the source of probe radiation are configured such that the infrared illuminated area can interact with a sample to affect the detected probe light.
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