CPC B08B 7/04 (2013.01) [B08B 3/048 (2013.01); B08B 3/12 (2013.01); B08B 3/14 (2013.01); B08B 5/02 (2013.01); H01J 37/32853 (2013.01)] | 11 Claims |
1. A method for conditioning a component of a wafer processing chamber, comprising:
placing the component in an ultrasonic conditioning solution in an ultrasonic solution tank;
applying ultrasonic energy through the ultrasonic conditioning solution from a megasonic transducer head to the component to clean the component;
submerging the component in a megasonic conditioning solution in a tank, wherein the submerging the component in the megasonic conditioning solution comprises mounting the component on a mount in the tank;
applying megasonic energy through the megasonic conditioning solution to the component to clean the component; and
flowing the megasonic conditioning solution during the applying megasonic energy; comprising:
flowing the megasonic conditioning solution into the tank at a location below where the component is mounted in the tank, through at least one inlet; and
draining the megasonic conditioning solution from the tank at a location above where the component is mounted in the tank,
wherein at least part of the inlet is under where the component is mounted in the tank;
on a mount in the tank,
wherein the megasonic transducer head is above the component and faces the inlet, wherein the component is between the inlet and the transducer head.
|