US 11,735,284 B2
Optimized seasoning trim values based on form factors in memory sub-system manufacturing
Tingjun Xie, Milpitas, CA (US); Murong Lang, San Jose, CA (US); and Zhenming Zhou, San Jose, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Oct. 6, 2022, as Appl. No. 17/961,193.
Application 17/961,193 is a continuation of application No. 17/465,020, filed on Sep. 2, 2021, granted, now 11,495,316.
Prior Publication US 2023/0062213 A1, Mar. 2, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G11C 29/10 (2006.01)
CPC G11C 29/10 (2013.01) 20 Claims
OG exemplary drawing
 
1. A method, comprising:
selecting, by a processor, a baseline set of trim values based on a set of memory sub-system form factors;
generating a first modified set of trim values for seasoning operations by modifying a first trim value of the baseline trim values;
causing each memory sub-system of a plurality of memory sub-systems to perform seasoning operations using the first modified set of trim values;
responsive to determining that a memory sub-system of the plurality of memory sub-system failed to satisfy a predetermined criterion, determining whether the memory sub-system is extrinsically defective;
responsive to determining that the memory sub-system is extrinsically defective, removing the extrinsically defective memory sub-system from the set of memory sub-systems; and
generating a second modified set of trim values for seasoning operations by modifying a second trim value of the first modified set of trim values.