US 11,734,094 B2
Memory component quality statistics
Seungjune Jeon, Santa Clara, CA (US); and Tingjun Xie, Milpitas, CA (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Aug. 19, 2020, as Appl. No. 16/997,562.
Prior Publication US 2022/0058071 A1, Feb. 24, 2022
Int. Cl. G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01)
CPC G06F 11/076 (2013.01) [G06F 11/0727 (2013.01); G06F 11/3034 (2013.01); G06F 11/3476 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
monitoring, by a processing device, error characteristics of a particular memory component among a plurality of memory components of a memory sub-system, wherein the monitored error characteristics of the particular memory component include a quantity of codewords having a bit flip count greater than a threshold bit flip count value associated therewith or a zero-to-one bit flip count greater than a threshold zero-to-one bit flip count value associated therewith, or both;
detecting, by the processing device and based on the monitored error characteristics, an error characteristic associated with the particular memory component that exhibits a value that is greater than or equal to a threshold error characteristic value; and
causing, by the processing device, a counter coupled to the plurality of memory components to be updated in response to the detection that the particular memory component exhibits the value of the error characteristic that is greater than or equal to the threshold error characteristic value.