CPC G01N 23/2252 (2013.01) [B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/36 (2021.01); B22F 10/85 (2021.01); B22F 12/90 (2021.01); B23K 15/002 (2013.01); B23K 15/0013 (2013.01); B23K 15/0086 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); H01J 37/244 (2013.01); H01J 37/305 (2013.01); G01N 2223/079 (2013.01); G01N 2223/303 (2013.01); G01N 2223/507 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/30433 (2013.01); H01J 2237/3128 (2013.01)] | 20 Claims |
1. An electron beam additive manufacturing system comprising:
an electron beam source;
an x-ray detection sensor configured to generate a waveform corresponding to an amount of x-rays detected by the x-ray detection sensor; and
an electronic control unit comprising a processor and a non-transitory computer-readable memory, the electronic control unit communicatively coupled to the electron beam source and the x-ray detection sensor, and the electronic control unit is configured to:
cause the electron beam source to emit an electron beam such that the electron beam impinges a verification plate,
receive the waveform generated by the x-ray detection sensor in response to the x-ray detection sensor capturing x-rays emitted from the impingement of the electron beam with the verification plate, and
determine a melt performance of a surface material of the verification plate based on the waveform.
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