CPC G01J 3/0256 (2013.01) [G01J 3/2823 (2013.01); G01J 2003/283 (2013.01); G01J 2003/4538 (2013.01)] | 20 Claims |
1. A spectrometer comprising:
a solid wedge etalon to generate a spatial interference pattern from a polychromatic object, the solid wedge etalon comprising a wedged layer having a first refractive index disposed on a substrate having a second refractive index lower than the first refractive index;
a detector array, in optical communication with the solid wedge etalon, to detect the spatial interference pattern generated by the solid wedge etalon; and
a processor, operably coupled to the detector array, to reconstruct a spectrum of the polychromatic object based at least in part on the spatial interference pattern and on a model of a spectral response of the solid wedge etalon,
wherein the model of the spectral response of the solid wedge etalon is based at least in part on a minimum thickness of the solid wedge etalon, a maximum thickness of the solid wedge etalon, and a wedge angle of the solid wedge etalon.
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