US 11,733,094 B2
Compact computational spectrometer using solid wedged low finesse etalon
Shawn Redmond, Concord, MA (US); Patrick Hassett, Nashua, NH (US); and Salvatore Di Cecca, Cambridge, MA (US)
Assigned to Massachusetts Institute of Technology, Cambridge, MA (US)
Filed by Massachusetts Institute of Technology, Cambridge, MA (US)
Filed on Dec. 9, 2021, as Appl. No. 17/546,631.
Claims priority of provisional application 63/147,615, filed on Feb. 9, 2021.
Prior Publication US 2022/0252452 A1, Aug. 11, 2022
Int. Cl. G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/453 (2006.01)
CPC G01J 3/0256 (2013.01) [G01J 3/2823 (2013.01); G01J 2003/283 (2013.01); G01J 2003/4538 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A spectrometer comprising:
a solid wedge etalon to generate a spatial interference pattern from a polychromatic object, the solid wedge etalon comprising a wedged layer having a first refractive index disposed on a substrate having a second refractive index lower than the first refractive index;
a detector array, in optical communication with the solid wedge etalon, to detect the spatial interference pattern generated by the solid wedge etalon; and
a processor, operably coupled to the detector array, to reconstruct a spectrum of the polychromatic object based at least in part on the spatial interference pattern and on a model of a spectral response of the solid wedge etalon,
wherein the model of the spectral response of the solid wedge etalon is based at least in part on a minimum thickness of the solid wedge etalon, a maximum thickness of the solid wedge etalon, and a wedge angle of the solid wedge etalon.