| CPC H10D 30/6755 (2025.01) [C01G 19/006 (2013.01); H10D 30/6757 (2025.01); H10D 62/40 (2025.01); H10D 62/405 (2025.01); H10D 62/80 (2025.01); C01P 2002/72 (2013.01)] | 6 Claims |

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1. A semiconductor device comprising:
an oxide semiconductor layer comprising a stack of a first film and a second film;
an insulating layer over the oxide semiconductor layer; and
a gate electrode over the insulating layer,
wherein the second film is positioned over the first film,
wherein one of the first film and the second film comprises an In—Sn—Ga—Zn—O-based oxide semiconductor film,
wherein each of the first film and the second film comprises a crystal,
wherein the second film comprises c-axis aligned crystals, and
wherein the c-axis aligned crystals in the second film have different a-axis directions and b-axis directions from each other.
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