| CPC H01L 23/49811 (2013.01) [H01L 21/4853 (2013.01); H01L 23/3107 (2013.01); H01L 23/49833 (2013.01); H01L 23/49838 (2013.01); H01L 23/5385 (2013.01); H01L 24/16 (2013.01); H01L 24/96 (2013.01); H01L 25/18 (2013.01); H01L 2224/16225 (2013.01)] | 20 Claims |

|
1. A semiconductor structure comprising:
an assembly including at least one semiconductor die and an interposer including interposer bonding pads;
a packaging substrate comprising substrate bonding pads; and
an array of copper pillar structures disposed between the interposer and the packaging substrate, wherein each of the copper pillar structures is bonded to a respective interposer bonding pad on the interposer and to a respective substrate bonding pad located on the packaging substrate,
wherein:
each of the copper pillar structures is bonded to the respective substrate bonding pad through a respective substrate-side solder material portion and is bonded to the respective interposer bonding pad through a respective interposer-side solder material portion;
the assembly comprises a fan-out package containing a plurality of semiconductor dies encapsulated by a molding compound die frame and attached to the interposer through a respective array of microbumps; and
each sidewall of the molding compound die frame is vertically coincident with a respective sidewall of the interposer.
|