US 12,394,569 B2
Multilayer capacitor
Beom Joon Cho, Suwon-si (KR)
Assigned to SAMSUNG ELECTRO-MECHANICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRO-MECHANICS CO., LTD., Suwon-si (KR)
Filed on Oct. 31, 2022, as Appl. No. 17/977,239.
Claims priority of application No. 10-2021-0193710 (KR), filed on Dec. 31, 2021.
Prior Publication US 2023/0215634 A1, Jul. 6, 2023
Int. Cl. H01G 4/12 (2006.01); H01G 4/232 (2006.01); H01G 4/30 (2006.01)
CPC H01G 4/1227 (2013.01) [H01G 4/232 (2013.01); H01G 4/30 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A multilayer capacitor comprising:
a body including a capacitance region in which at least one first internal electrode and at least one second internal electrode are alternately stacked on each other, having at least one dielectric layer interposed therebetween in a first direction; and
first and second external electrodes disposed on the body while being spaced apart from each other to be respectively connected to the at least one first internal electrode and the at least one second internal electrode,
wherein the body further includes a cover layer disposed to overlap the capacitance region in the first direction,
the cover layer includes an upper cover layer providing an upper surface of the body and a lower cover layer providing a lower surface of the body,
a portion of the first or second external electrode is disposed on a portion of the upper or lower surface of the body,
1.15 or more is a value obtained by dividing a sum of respective major-axis lengths Lx of a plurality of crystal grains included in the cover layer by a sum of respective minor-axis lengths Sx of the plurality of crystal grains,
the sum of Lx is the sum of the major-axis lengths of the plurality of crystal grains closest to a center of one of the upper cover layer and the lower cover layer, based on a cross section of the body, including the center and formed by a second direction in which the first and second external electrodes face each other and the first direction, and
the sum of Sx is the sum of the minor-axis lengths of the plurality of crystal grains closest to the center, based on the cross section.