US 12,394,498 B2
Memory device and operating method of the memory device
Yeong Jo Mun, Icheon-si (KR); and Sung Hyun Hwang, Icheon-si (KR)
Assigned to SK hynix Inc., Icheon-si (KR)
Filed by SK hynix Inc., Icheon-si (KR)
Filed on Mar. 27, 2024, as Appl. No. 18/618,460.
Application 18/618,460 is a continuation of application No. 17/702,560, filed on Mar. 23, 2022, granted, now 11,984,173.
Claims priority of application No. 10-2021-0128051 (KR), filed on Sep. 28, 2021.
Prior Publication US 2024/0257885 A1, Aug. 1, 2024
This patent is subject to a terminal disclaimer.
Int. Cl. G11C 16/04 (2006.01); G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/24 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/32 (2006.01)
CPC G11C 16/3459 (2013.01) [G11C 16/08 (2013.01); G11C 16/10 (2013.01); G11C 16/24 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01); G11C 16/32 (2013.01)] 7 Claims
OG exemplary drawing
 
1. A memory device comprising:
a plurality of memory cells coupled between a plurality of word lines and a plurality of bit lines;
a control circuit suitable for repeatedly performing a plurality of program loops until programming for a selected word line among the plurality of word lines is completed; and
wherein the control circuit performs the following in each of the program loops:
generates any one of N types of column voltages according to values of N types of M-bit setting codes input to a page buffer, and applies the generated column voltage to each of a plurality of bit lines, in a bit line setup operation,
applies a program voltage for the selected word line in a program voltage application operation,
applies (N−1) first verification voltages to the selected word line according to a predetermined order to check N types of first program states for each of a plurality of memory cells included in the selected word line in a verification operation, and
determines the values of the N types of M-bit setting codes to be input to the page buffer in the bit line setup operation of a subsequent program loop, on the basis of a result of the application of the (N−1) first verification voltages to the selected word line according to the predetermined order,
wherein “N” is a natural number equal to or greater than 4, and “M” is a natural number equal to or greater than 2.