| CPC G03F 7/70925 (2013.01) [B08B 7/0035 (2013.01); B08B 13/00 (2013.01); H01L 21/02057 (2013.01); H01L 22/12 (2013.01); H05H 1/01 (2021.05)] | 20 Claims |

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1. A method of manufacturing a semiconductor device comprising:
retrieving a substrate from a substrate storage;
transferring the substrate to a cleaning device;
inspecting a surface of the substrate;
generating a map of one or more particles on the surface of the substrate, wherein the map includes particle locations and the map includes particle sizes;
consecutively cleaning the one or more particles from the surface of the substrate in the cleaning device, by moving the substrate according to the map and by exposing the surface of the substrate to a plasma wind stream at an oblique angle with respect to a perpendicular plane to the surface of the substrate for a predetermined exposure time to remove the one or more particles from the surface of the substrate;
adjusting a speed of the plasma wind stream based on the particle sizes;
adjusting a width of an output opening of an output port of an ambient plasma generator to adjust the speed of the plasma wind stream; and
transferring the substrate to a semiconductor manufacturing apparatus.
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