US 12,392,822 B2
Voltage glitch detectors
Timothy Thomas Rueger, Liberty Hill, TX (US); Dewitt Clinton Seward, Arlington, MA (US); and Gang Yuan, Austin, TX (US)
Assigned to Silicon Laboratories Inc., Austin, TX (US)
Filed by Silicon Laboratories Inc., Austin, TX (US)
Filed on Aug. 17, 2023, as Appl. No. 18/235,156.
Prior Publication US 2025/0060409 A1, Feb. 20, 2025
Int. Cl. G01R 31/30 (2006.01); G01R 19/165 (2006.01); G01R 31/40 (2020.01); G06F 21/75 (2013.01)
CPC G01R 31/3004 (2013.01) [G01R 19/16552 (2013.01); G01R 31/40 (2013.01); G06F 21/755 (2017.08)] 23 Claims
OG exemplary drawing
 
1. An integrated circuit comprising:
a positive voltage glitch detector including,
a filter coupled to a supply voltage node and configured to supply a filtered supply voltage;
a capacitor coupled between the supply voltage node and a first node;
a resistor coupled between the first node and a ground node;
a first circuit having an input coupled to the first node, the first circuit being coupled to receive the filtered supply voltage as a first circuit supply voltage and the first circuit being configured to supply a first output signal;
a latch circuit having a clock input coupled to the first output signal and having a data input coupled to the filtered supply voltage; and
wherein responsive to a positive voltage glitch occurring on the supply voltage node, a positive voltage pulse is generated on the first node corresponding to the positive voltage glitch, the latch circuit is clocked by the first output signal, and a state of the latch circuit is changed and the latch circuit supplies an asserted output signal indicative of the positive voltage glitch.