US 12,392,798 B2
Socket device for testing ICS
Dong Weon Hwang, Seongnam-si (KR); Logan Jae Hwang, Beverly Hills, CA (US); and Jae Baek Hwang, Seongnam-si (KR)
Assigned to Dong Weon Hwang, Seongnam-si (KR); Logan Jae Hwang, Beverly Hills, CA (US); Jae Baek Hwang, Seongnam-si (KR); and HICON CO., LTD., Seongnam-si (KR)
Filed by Dong Weon Hwang, Seongnam-si (KR); Logan Jae Hwang, Beverly Hills, CA (US); Jae Baek Hwang, Seongnam-si (KR); and HICON CO., LTD., Seongnam-si (KR)
Filed on Nov. 10, 2023, as Appl. No. 18/506,878.
Claims priority of application No. 10-2022-0167711 (KR), filed on Dec. 5, 2022.
Prior Publication US 2024/0183879 A1, Jun. 6, 2024
Int. Cl. G01R 1/04 (2006.01)
CPC G01R 1/0466 (2013.01) [G01R 1/0458 (2013.01); G01R 1/0483 (2013.01)] 8 Claims
OG exemplary drawing
 
1. A socket device for testing integrated circuits (ICs), comprising:
a contact module for seating an IC and having a plurality of contacts for electrical connection of a lead of the IC and a terminal of a printed circuit board (PCB); and
a pusher module having a latch to be fit-assembled from a top of the contact module and for pressurizing the IC,
wherein the pusher module comprises:
a lead frame with the latch rotatably provided thereto;
a pressurizing part assembled to the lead frame with two floating hinge axes parallel to each other and elastically supported against the lead frame to be movable up and down to elastically pressurize the IC;
first and second cam shafts provided in the respective floating hinge axes to adjust a vertical height of the pressurizing part depending on a rotation angle thereof;
a handle rotatably fixed with the first cam shaft;
a lever rotatably fixed with the second cam shaft; and
a link having opposite ends rotatably connected to the handle and the lever.