US 12,391,001 B2
Nanostructures for process monitoring and feedback control
Morteza Safai, Newcastle, WA (US); and Gary E. Georgeson, Federal Way, WA (US)
Assigned to The Boeing Company, Chicago, IL (US)
Filed by The Boeing Company, Chicago, IL (US)
Filed on Nov. 15, 2021, as Appl. No. 17/527,054.
Application 17/527,054 is a division of application No. 15/495,925, filed on Apr. 24, 2017, granted, now 11,173,664.
Prior Publication US 2022/0072793 A1, Mar. 10, 2022
Int. Cl. B33Y 10/00 (2015.01); B29C 64/386 (2017.01); B33Y 50/00 (2015.01); B82Y 35/00 (2011.01); B82Y 40/00 (2011.01)
CPC B29C 64/386 (2017.08) [B33Y 10/00 (2014.12); B33Y 50/00 (2014.12); B82Y 35/00 (2013.01); B82Y 40/00 (2013.01); Y10S 977/774 (2013.01); Y10S 977/892 (2013.01); Y10S 977/955 (2013.01); Y10S 977/956 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A kit comprising:
a material comprising a plurality of nanostructures distributed therein, wherein each nanostructure comprises a quantum dot and a shell encompassing the quantum dot, wherein the shells are configured to emit a first wavelength in response to an excitation signal, and wherein the quantum dots are configured to emit a second wavelength in response to the excitation signal; and
a system comprising:
a manufacturing device configured to form a layer of material from the material and perform a manufacturing operation on the layer of material prior to application of the excitation signal;
an excitation device configured to apply the excitation signal to at least a portion of the layer of material;
a detection device configured to detect an emitted signal having a first intensity at the first wavelength and a second intensity at the second wavelength from at least a subset of the plurality of nanostructures in response to the excitation signal; and
a computing device configured to determine whether a manufacturing characteristic has been satisfied for the layer based at least on the first intensity at the first wavelength and the second intensity at the second wavelength, wherein the computing device determines that the manufacturing characteristic has not yet been satisfied if the second intensity is below a threshold;
wherein the first wavelength is based on a first band gap associated with the shells of the nanostructures in the portion; and
wherein the second wavelength is based on a second band gap associated with the quantum dots of the nanostructures in the portion.