US 12,390,807 B2
Chip loading structure, analysis device, and analysis system
Mengjun Hou, Beijing (CN); Xiangguo Ma, Beijing (CN); Kai Geng, Beijing (CN); Qiong Wu, Beijing (CN); Youxue Wang, Beijing (CN); and Zongmin Liu, Beijing (CN)
Assigned to Beijing BOE Technology Development Co., Ltd., Beijing (CN); and BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN)
Appl. No. 17/638,885
Filed by Beijing BOE Technology Development Co., Ltd., Beijing (CN); and BOE TECHNOLOGY GROUP CO., LTD., Beijing (CN)
PCT Filed Apr. 29, 2021, PCT No. PCT/CN2021/090878
§ 371(c)(1), (2) Date Feb. 28, 2022,
PCT Pub. No. WO2022/226868, PCT Pub. Date Nov. 3, 2022.
Prior Publication US 2024/0042431 A1, Feb. 8, 2024
Int. Cl. B01L 3/00 (2006.01)
CPC B01L 3/502715 (2013.01) [B01L 2200/025 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0819 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/1827 (2013.01); B01L 2400/0487 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A chip loading structure comprising a loading plate body, wherein the loading plate body has an accommodating space configured to accommodate a detection chip;
a first hollow area and at least one second hollow area, which penetrate to the accommodating space, are formed on a first plate surface of the loading plate body, wherein the first hollow area is configured to expose a reaction observation area of the detection chip from the first plate surface; and the at least one second hollow area is configured to expose at least one reagent port of the detection chip from the first plate surface; and
the loading plate body is further provided with a connection portion which is detachably connectable to a transportation section in an analysis device, the transportation section being configured to transport the loading plate body;
wherein a first recess is disposed on the first plate surface at a position where the first hollow area is located, an area of an orthographic projection of the first recess on the first plate surface is larger than an area of an orthographic projection of the first hollow area on the first plate surface, and the orthographic projection of the first recess on the first plate surface completely covers the orthographic projection of the first hollow area on the first plate surface, and
wherein the orthographic projection of the first recess on the first plate surface does not overlap with the orthographic projection of the second hollow area on the first plate surface.