US 12,380,846 B2
Luminance compensation method and device, readable storage medium, and display device
Fan Tian, Guangdong (CN)
Assigned to Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd., Shenzhen (CN)
Appl. No. 17/790,165
Filed by Shenzhen China Star Optoelectronics Semiconductor Display Technology Co., Ltd., Guangdong (CN)
PCT Filed May 26, 2022, PCT No. PCT/CN2022/095097
§ 371(c)(1), (2) Date Jun. 30, 2022,
PCT Pub. No. WO2023/216321, PCT Pub. Date Nov. 16, 2023.
Claims priority of application No. 202210521653.9 (CN), filed on May 13, 2022.
Prior Publication US 2024/0212600 A1, Jun. 27, 2024
Int. Cl. G09G 3/3233 (2016.01)
CPC G09G 3/3233 (2013.01) [G09G 2320/0233 (2013.01); G09G 2320/043 (2013.01); G09G 2320/0626 (2013.01); G09G 2330/021 (2013.01); G09G 2360/16 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A luminance compensation method, wherein the luminance compensation method comprises following steps:
obtaining a luminance value of each of all subpixels when operation time is t;
obtaining a minimum luminance value from luminance values of all the subpixels;
obtaining a standard luminance value of the subpixels when the operation time is t;
comparing the minimum luminance value with the standard luminance value to obtain a compensated luminance value; and
driving all the subpixels according to the compensated luminance value,
wherein the step of obtaining the luminance value of the each of all the subpixels when the operation time is t comprises following steps:
dividing the operation time t of a subpixel into N time periods, wherein N is greater than or equal to 1;
obtaining a driving current value I of the subpixel in each of the time periods, and obtaining a total of N driving current values of the subpixel in the N time periods, which are respectively I1, I2, . . . and IN;
converting the N driving current values into current stress values to obtain N current stress values, which are respectively stressI1, stressI2, . . . and stressIN;
stressIN=α×stressref, wherein stressref is a current stress value of the subpixel at a reference current Iref, α=IN/Iref or α=(IN/Iref)b, b is a characteristic parameter of an organic light emitting device of the subpixel;
adding the N current stress values to obtain an accumulated value sumstress; and
obtaining a luminance value L of the subpixel according to the accumulated value sumstress,

OG Complex Work Unit Math
wherein L0 is an initial luminance value of the subpixel, and β and τ are characteristic parameters of the organic light emitting device of the subpixel.