US 12,379,432 B2
Magnetic field detection apparatus
Keisuke Takasugi, Tokyo (JP); and Kenzo Makino, Tokyo (JP)
Assigned to TDK CORPORATION, Tokyo (JP)
Filed by TDK CORPORATION, Tokyo (JP)
Filed on Sep. 16, 2022, as Appl. No. 17/946,817.
Claims priority of application No. 2021-154816 (JP), filed on Sep. 22, 2021; and application No. 2022-009846 (JP), filed on Jan. 26, 2022.
Prior Publication US 2023/0092757 A1, Mar. 23, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G01R 33/09 (2006.01)
CPC G01R 33/09 (2013.01) 13 Claims
OG exemplary drawing
 
1. A magnetic field detection apparatus comprising:
a substrate including a flat surface;
a first projection and a second projection each provided on the flat surface and each including a first inclined surface and a second inclined surface, the first inclined surface being inclined with respect to the flat surface, the second inclined surface being inclined with respect to both the flat surface and the first inclined surface;
a first magnetoresistive effect film provided on the first inclined surface;
a second magnetoresistive effect film provided on the second inclined surface;
a first wiring line coupling the first magnetoresistive effect film provided on the first inclined surface of the first projection and the first magnetoresistive effect film provided on the first inclined surface of the second projection to each other; and
a second wiring line coupling the second magnetoresistive effect film provided on the second inclined surface of the first projection and the second magnetoresistive effect film provided on the second inclined surface of the second projection to each other, wherein
the first wiring line and the second wiring line intersect on the first inclined surface, the second inclined surface, or both.