US 12,379,413 B2
Semiconductor test equipment and method of performing current and voltage test measurements
YongJu Lee, Seoul (KR); SeongHyun Kang, Incheon (KR); and JiWon Seong, Incheon (KR)
Assigned to JCET STATS ChipPAC Korea Limited, (KR)
Filed by JCET STATS ChipPAC Korea Limited, Incheon (KR)
Filed on Aug. 9, 2022, as Appl. No. 17/818,520.
Prior Publication US 2024/0053400 A1, Feb. 15, 2024
Int. Cl. G01R 31/28 (2006.01); G01R 1/04 (2006.01)
CPC G01R 31/2886 (2013.01) [G01R 1/0408 (2013.01); G01R 31/2879 (2013.01)] 25 Claims
OG exemplary drawing
 
1. A semiconductor test system, comprising:
a single test fixture including a plurality of test cells disposed on the single test fixture and arranged in parallel rows and columns, wherein each test cell on the single test fixture has the same arrangement including a housing accommodating one and only one device under test (DUT) disposed in a DUT placement area within the housing, and an electrical test circuit disposed within the housing solely dedicated for the one and only one DUT and containing test circuitry dedicated to perform simultaneous, real-time voltage and current testing solely for the one and only one DUT within its test cell; and
a user interface displaying the real-time voltage and current testing for all test cells simultaneously.