| CPC G01N 23/041 (2018.02) [G01N 23/046 (2013.01); G01N 23/083 (2013.01); G06T 11/008 (2013.01); G01N 2223/04 (2013.01); G01N 2223/30 (2013.01); G01N 2223/401 (2013.01); G01N 2223/419 (2013.01)] | 31 Claims |

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1. An X-ray analyzer grating configured for use in a one shot interferometric imaging system with image resolution recovery, the interferometric imaging system comprising an X-ray source and an X-ray detector with an X-ray fringe plane between the X-ray source and the X-ray detector, wherein an X-ray fringe pattern is formed at the X-ray fringe plane, wherein the X-ray analyzer grating located at the X-ray fringe plane, comprises:
a plurality of grating pixels across two dimensions of the X-ray analyzer grating, wherein each grating pixel of the plurality of grating pixels has a shifted phase with respect to adjacent grating pixels in at least two dimensions to the grating pixel so that adjacent grating pixels in at least two dimensions have a shifted phase with respect to the grating pixel.
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