US 12,374,420 B2
Carrier based high volume system level testing of devices with pop structures
Karthik Ranganathan, Foothill Ranch, CA (US); Gregory Cruzan, Anaheim, CA (US); Samer Kabbani, Laguna Niguel, CA (US); Gilberto Oseguera, Corona, CA (US); and Ira Leventhal, San Jose, CA (US)
Assigned to Advantest Test Solutions, Inc., San Jose, CA (US)
Filed by Advantest Test Solutions, Inc., San Jose, CA (US)
Filed on Feb. 19, 2023, as Appl. No. 18/171,373.
Application 18/171,373 is a continuation of application No. 17/531,486, filed on Nov. 19, 2021, granted, now 11,587,640.
Claims priority of provisional application 63/158,082, filed on Mar. 8, 2021.
Prior Publication US 2023/0197185 A1, Jun. 22, 2023
Int. Cl. G01R 31/319 (2006.01); G01R 31/28 (2006.01); G11C 29/56 (2006.01)
CPC G11C 29/56016 (2013.01) [G01R 31/2863 (2013.01); G01R 31/2867 (2013.01); G01R 31/31905 (2013.01); G11C 2029/5602 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A tester comprising:
a socket structure configured to receive a device-under-test (DUT) held in a membrane pocket;
a package-on-package (POP) structure configured to couple to the DUT from a vertical position relative to the DUT; and
an actuator configured to engage the POP structure, the DUT, the membrane pocket, and the socket structure into a testing arrangement that pushes the DUT through the membrane pocket to make electrical and physical contact with the socket structure.