US 12,368,450 B2
Method of calibrating output of ADC and ADC using the same
Hsuan Chih Yeh, New Taipei (TW); Yu-Yee Liow, Hsinchu County (TW); Wen-Hong Hsu, Hsinchu (TW); Po-Hua Chen, Changhua County (TW); Chihwei Wu, Kaohsiung (TW); and Pei Wen Sun, Hsinchu County (TW)
Assigned to United Microelectronics Corp., Hsinchu (TW)
Filed by United Microelectronics Corp., Hsinchu (TW)
Filed on Sep. 11, 2023, as Appl. No. 18/464,291.
Claims priority of application No. 112133068 (TW), filed on Aug. 31, 2023.
Prior Publication US 2025/0080129 A1, Mar. 6, 2025
Int. Cl. H03M 1/10 (2006.01); H03M 1/46 (2006.01)
CPC H03M 1/1023 (2013.01) [H03M 1/466 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of calibrating an output of an analog to digital converter (ADC), the method comprising:
generating, by a digital to analog (DAC) converter, a positive input delta voltage;
receiving, by a comparator, the positive input delta voltage to generate a first digital output value;
generating, by the DAC, a negative input delta voltage having a same magnitude as the positive input delta voltage;
receiving, by the comparator, the negative input delta voltage to generate a second digital output value;
determining, by a logic circuit, a digital quantization code according to half of a sum of the first digital output value and the second digital output value; and
calibrating, by a calibration circuit, the output of the ADC by using the digital quantization code to eliminate an offset error value.