US 12,366,876 B2
Voltage glitch detector
Venkatesh Kadlimatti, Sivasagar (IN); Aritra Chowdhury, Bangalore (IN); and Harikrishna P, Bangalore (IN)
Assigned to Texas Instruments Incorporated, Dallas, TX (US)
Filed by Texas Instruments Incorporated, Dallas, TX (US)
Filed on Apr. 28, 2023, as Appl. No. 18/309,340.
Prior Publication US 2024/0361794 A1, Oct. 31, 2024
Int. Cl. G05F 3/24 (2006.01); G05F 1/565 (2006.01); G05F 3/26 (2006.01)
CPC G05F 3/247 (2013.01) [G05F 1/565 (2013.01); G05F 3/262 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A voltage glitch detector comprising:
a current source including first and second terminals;
a latch including an input and an output;
a first transistor including a source, a drain, and a gate;
a second transistor including a source, a drain, and a gate;
a third transistor including a source, a drain, and a gate, the source of the third transistor coupled to the source of the second transistor, and the gate and drain of the third transistor coupled to the gate of the first transistor, the gate of the second transistor, and the first terminal of the current source;
a fourth transistor including a source, a drain, and a gate, the drain of the fourth transistor coupled to the drain of the first transistor and the input of the latch; and
a fifth transistor including a source, a drain, and a gate, the source of the fifth transistor coupled to the source of the fourth transistor and the second terminal of the current source, and the gate and drain of the fifth transistor coupled to the gate of the fourth transistor and the drain of the second transistor.