US 12,038,452 B2
Specimen carrier
Shigeki Yamaguchi, Tokyo (JP); Hiroshi Watanabe, Tokyo (JP); and Kazuma Tamura, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 17/278,413
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed Feb. 14, 2020, PCT No. PCT/IB2020/051223
§ 371(c)(1), (2) Date Mar. 22, 2021,
PCT Pub. No. WO2020/148735, PCT Pub. Date Jul. 23, 2020.
Claims priority of application No. 2019-004059 (JP), filed on Jan. 15, 2019.
Prior Publication US 2021/0356485 A1, Nov. 18, 2021
Int. Cl. B01L 3/00 (2006.01); B01L 9/00 (2006.01); G01N 35/00 (2006.01); G01N 35/04 (2006.01)
CPC G01N 35/04 (2013.01) [B01L 3/508 (2013.01); B01L 9/00 (2013.01); G01N 35/00732 (2013.01); B01L 2300/021 (2013.01); B01L 2300/0609 (2013.01); B01L 2300/0832 (2013.01); B01L 2300/161 (2013.01); B01L 2300/168 (2013.01); B65G 2201/0261 (2013.01); G01N 2035/00752 (2013.01)] 3 Claims
OG exemplary drawing
 
1. A specimen carrier, comprising:
a cylindrical base having a bottom surface;
a specimen holder disposed on the cylindrical base configured to hold a specimen container having an identification (ID) label disposed thereon;
a high friction member disposed on the bottom surface of the cylindrical base offset from a central axis of the cylindrical base; and
a window disposed on the specimen holder through which the ID label of the specimen container is visible,
wherein the high friction member is immobile with respect to the bottom surface of the cylindrical base, and
wherein the high friction member is disposed 90 degrees from the window with respect to the central axis.