| CPC H10B 51/20 (2023.02) [H10B 51/10 (2023.02); H10B 51/30 (2023.02); H10D 62/80 (2025.01)] | 20 Claims |

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1. A memory device, comprising:
a multi-layer stack, comprising a plurality of conductive layers and a plurality of dielectric layers stacked alternately along a first direction;
a channel layer;
a memory material layer, disposed between the channel layer and each of the conductive layers and the dielectric layers; and
at least three conductive pillars extending in the first direction, wherein the at least three conductive pillars are aligned along a second direction substantially perpendicular to the first direction.
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