US 12,360,867 B2
Memory fault recovery method and system, and memory
Yangbin Diao, Chengdu (CN); Lei Yuan, Chengdu (CN); Hua Chen, Dongguan (CN); and Yonggui Liang, Shenzhen (CN)
Assigned to HUAWEI TECHNOLOGIES CO., LTD., Shenzhen (CN)
Filed by Huawei Technologies Co., Ltd., Shenzhen (CN)
Filed on Feb. 9, 2024, as Appl. No. 18/437,707.
Application 18/437,707 is a continuation of application No. PCT/CN2022/092017, filed on May 10, 2022.
Claims priority of application No. 202110943369.6 (CN), filed on Aug. 17, 2021; and application No. 202210214956.6 (CN), filed on Mar. 7, 2022.
Prior Publication US 2024/0176714 A1, May 30, 2024
Int. Cl. G06F 11/20 (2006.01)
CPC G06F 11/2094 (2013.01) 20 Claims
OG exemplary drawing
 
1. A method comprising:
locating, by a processor, a first memory chip that is faulty in a memory system;
isolating or replacing the first memory chip; and
resetting, by the processor after isolating or replacing the first memory chip, the first memory chip when second memory chips in the memory system continue to work normally.