| CPC G01N 21/55 (2013.01) [B23K 1/008 (2013.01); G01B 11/06 (2013.01); G01B 11/0625 (2013.01)] | 16 Claims |

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1. A detection method, comprising:
placing a substrate in a reflow oven, wherein a solder flux volatilized in the reflow oven is capable of adhering to a surface of the substrate to form a solder flux layer;
detecting a thickness of the solder flux layer; and
calculating a concentration of the solder flux in the reflow oven based on the thickness of the solder flux layer.
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